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3M 7100044153

CUBITRONII HOOKITPAPER DISC 732U

Answer first: this page is a purchasing reference for the exact part number 7100044153 from 3M. Use it to start datasheet, package, manufacturer and RFQ verification; do not treat page text as a live stock, price or lead-time promise.

Manufacturer: 3M Part number: 7100044153 Package: RFQ verification required

Key Parameters

Part Number7100044153
Manufacturer3M
CategoryAbrasives and Surface Conditioning Products
seriesCubitron™ II
packagingBulk
product statusActive
param 1Abrasive Disc
param 2Ceramic
param 3-
param 480
param 5-
param 6Purple
param 7-
param 8-
param 96.00" (152.40mm)
param 10Finishing, Grinding

Parameters are provided for purchasing review. Confirm package, suffix, lifecycle status, datasheet revision and approved substitutes before ordering.

How to Verify 7100044153 Before Ordering

Datasheet and parameter checks

  • Confirm the full manufacturer part number, not only a shortened search keyword.
  • Compare package, pinout, dimensions, voltage or rating fields, temperature range and compliance wording against the released BOM.
  • Use the manufacturer datasheet or drawing for electrical and mechanical limits before approving a substitute.

RFQ fields SENICO needs

  • Send exact part number, manufacturer, quantity, target delivery date, destination and required packaging.
  • State whether alternates are allowed, and list any date-code, certificate, traceability or customer AVL requirement.
  • Keep exact stock, factory lead time and proposed alternatives in separate quote lanes.

For 7100044153, SENICO recommends checking manufacturer marking, package, date code, requested quantity, approved vendor requirements and replacement risk before issuing a purchase order. If a supplier suggests an equivalent, record the changed fields and approval owner before comparing price.

We do not treat displayed data as a real-time stock or price commitment. The RFQ reply is the verified commercial reference.

Related buying guides: stock and lead-time verification, equivalent IC comparison, and BOM RFQ preparation.